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Multi functional scanning probe microscope AFM100 Plus/AFM100 system
The AFM100 Plus/AFM100 system is a universal high-resolution scanning probe microscope system designed to popularize AFM applications in various field
Product details
Multi functional scanning probe microscope AFM100 Plus/AFM100 system
The AFM100 Plus/AFM100 system is a universal high-resolution scanning probe microscope system designed to popularize AFM applications in various fields such as research and development, production, and education, while pursuing operability, reliability, and efficient observation.
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characteristic
characteristic
Pre installed probe system enables reliable probe replacement
One click automatic measurement/processing/analysis
Using AFM marking function to achieve same field of view observation and analysis of AFM-SEM-EDS
Application Data
Introduce the application data of scanning probe microscopy.
describe
Explain the principles and various states of scanning tunneling microscopy (STM) and atomic force microscopy (AFM).
History and SPM Development
Describe the history and development of our scanning probe microscope and our equipment. (Global site)
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